| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device capable of testing its own circuit operating at a high speed by using a general low speed LSI tester. SOLUTION: This semiconductor device 1 having a testing circuit 2 operating at a high speed, internally stores a high speed pattern generating circuit 3 for coverting a low speed test pattern of a reference clock, an input signal and an output expected value signal inputted from the low speed LSI tester into a test pattern of a speed adapted to the testing circuit 2 operating at a high speed. |
