发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a compact MOSFET for high frequencies whose thermal noise can be reduced by using silicon. SOLUTION: This MOSFET is provided with an element isolation region 3 formed on the main surface of a first conductivity type silicon substrate, a gate electrode 5 arranged on the element isolation region, a first conductivity type impurity region 11 including first conductivity type impurity whose concentration is higher than that of the silicon substrate to which a substrate potential is applied, and a second conductivity type impurity region 6 including the first conductivity type impurity whose concentration is higher than that of the silicon substrate formed in a region ranging from the substrate under the element isolation region to the first conductivity type impurity region.
申请公布号 JP2001291863(A) 申请公布日期 2001.10.19
申请号 JP20000106369 申请日期 2000.04.07
申请人 MITSUBISHI ELECTRIC CORP 发明人 FURUKAWA AKIHIKO;SUGAHARA KAZUYUKI
分类号 H01L21/76;H01L21/8234;H01L27/08;H01L27/088;H01L29/78;(IPC1-7):H01L29/78;H01L21/823 主分类号 H01L21/76
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