发明名称 INSPECTING JIG FOR ELECTRONIC CIRCUIT BOARD
摘要 PROBLEM TO BE SOLVED: To provide an inspecting jig for an electronic circuit board wherein a problem related to use of a probe is solved, to assure continuity regardless of thickness of a resist print layer, resulting in improved manufacturing yield and quick manufacture. SOLUTION: An inspecting jig is pressurized to an electronic circuit board 2 and a voltage is applied between the electronic circuit board 2 and the inspecting jig for inspecting electric characteristics of the electronic circuit board 2. Here, the electronic circuit board 2 comprises a board 3, a wiring pattern 4 laminated on the board 3, a resist print layer 5 laminated on the wiring pattern 4, a plurality of openings 8 which are formed at the resist print layer 5 to expose an electrode 7 of the wiring pattern 4, and a plurality of pads 6 which are formed on the rear surface of the board 3 for continuity with the wiring pattern 4. The inspecting jig comprises a conductive rubber 10 of hardness 60 deg.-80 deg. or less (JIS K6301). A plurality of protruding pieces 11 contacting the electrode 7 of the wiring pattern 4 through the opening 8 of the resist print layer 5 are laser-engraved on the opposite surface contacting the resist print layer 5 of he conductive rubber 10, with the width of each protruding piece 11 being 1.0-1.4 times of the width of opening 8.
申请公布号 JP2001289899(A) 申请公布日期 2001.10.19
申请号 JP20000103878 申请日期 2000.04.05
申请人 SHIN ETSU POLYMER CO LTD 发明人 TANIGUCHI ATSUSHI
分类号 G01R1/06;G01R31/02;G01R31/28;H01L21/66;H05K3/00;(IPC1-7):G01R31/02 主分类号 G01R1/06
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