发明名称 SEMICONDUCTOR DEVICE FOR PROTECTION AGAINST STATIC ELECTRICITY
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device for protection against static electricity which can be refined more. SOLUTION: This semiconductor device for protection against static electricity contains a P type well 11 containing a P type impurity diffusion layer 90, and an N type impurity diffusion layer 20, and an N type well 13 which is formed in the P type well 11, and contains a P type impurity diffusion layer 30 and an N type impurity diffusion layer 40. Furthermore, a first bipolar transistor 210 is constituted by the P type impurity diffusion layer 30, the N type well 13 and the P type well 11, a second bipolar transistor 220 is constituted by the N type impurity diffusion layer 20, the P type well 11 and the N type well 13, and a Zener diode 230 is constituted by an N type impurity diffusion layer 50, and a P type impurity diffusion layer 60 formed on a bottom face of the N type impurity diffusion layer 50.
申请公布号 JP2001291836(A) 申请公布日期 2001.10.19
申请号 JP20000109202 申请日期 2000.04.11
申请人 SEIKO EPSON CORP 发明人 OKAWA KAZUHIKO
分类号 H01L29/74;H01L21/822;H01L21/8238;H01L27/04;H01L27/06;H01L27/092;(IPC1-7):H01L27/04;H01L21/823 主分类号 H01L29/74
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