| 摘要 |
PROBLEM TO BE SOLVED: To achieve an improvement in production efficiency by discovering faults which occurred in a manufacturing process early and reducing a process loss after the vapor deposition of organic layer and electrode. SOLUTION: After having passed through vapor deposition processes (c) to (f) to vapor-deposit the organic layer and electrode, a test process (g) to perform a predetermined test to the vapor-deposited organic layer and electrode is equipped, and a sealing process (h) is performed after the test process.
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