发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT AND POWER SUPPLY VOLTAGE MEASURING DEVICE FOR SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To observe the power supply voltage value and its fluctuating value in a semiconductor integrated circuit in a noncontact state. SOLUTION: On a voltage value on a power supply wire 1 in the semiconductor integrated circuit 10, the period of a constant frequency carrier wave signal is modulated by using an FM modulating circuit 3 built in the semiconductor integrated circuit 10. This constant frequency carrier wave signal is outputted as a radio wave from a transmitting side antenna 4 arranged in the semiconductor integrated circuit 10. The radio wave is received by a receiving side antenna 5 to be converted into a voltage value by an FM demodulating circuit 6. The converted voltage value is observed by an oscilloscope 7 connected to the FM demodulating circuit 6. The transmitting side antenna and the receiving side antenna 5 can be realized, for example, by wiring (1 to 2 cm) on a printed board.
申请公布号 JP2001289914(A) 申请公布日期 2001.10.19
申请号 JP20000107953 申请日期 2000.04.10
申请人 NEC ENG LTD 发明人 KUBO KATSUSHI
分类号 G01R31/26;G01R13/20;G01R31/28;H01L21/66;(IPC1-7):G01R31/28 主分类号 G01R31/26
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