发明名称 SELECTIVE CORNEAL ABERROMETRY
摘要 <p>A method and system are disclosed for measuring and mapping the anterior surface topography of a cornea to determine corneal aberrations and an optimal ablation pattern for refractive and therapeutic surgery of the cornea. The invention stimulates a prospective ablation process with real-time visual feedback accurately portraying results of topographic surface alteration that would occur during an actual ablation procedure, thereby achieving minimal conreal aberrations and optimal image quality.</p>
申请公布号 WO2001077739(A2) 申请公布日期 2001.10.18
申请号 EP2001004142 申请日期 2001.04.11
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