GENERATING DEVICE FOR TEST PATTERN AND STROBE SIGNAL AND INSERTING METHOD FOR DELAY TIME INTO TIMING DATA

摘要

PURPOSE: A generating device for a test pattern and a strobe signal and an inserting method for delay time into timing data are provided to insert an additional delay time to the timing data of a specific event in an event type semiconductor test system for testing an electronic device to be tested by generating events of various timing. CONSTITUTION: A delay time inserting device is formed with an event memory for storing the timing data and event type data of each event and an inserting portion for inserting the delay time into the timing data of a specified event. An event having the total delay time by far longer than the time length capable of being expressed by the allocated number of data bits is generated by inserting the delay time into the timing data of the specified event. The inserting portion inserts the delay time by repeating the specified timing data and event type data for the event directly before the specified event.