发明名称 |
APPARATUS FOR DETECTING WAFER PROTRUSION OF SMIF SYSTEM |
摘要 |
PURPOSE: An SMIF(Standard Mechanical Interface) system is provided to detect a protrusion of wafers loaded in an SMIF cassette, thereby preventing a breakage of the wafer. CONSTITUTION: In the SMIF system, a frame(240) for mounting a sensor for detecting a wafer protrusion surrounds a carrier(250). A sensing part is mounted to the frame(240) for detecting the protrusion of a wafer(220) loaded in each slot of the carrier(250). The sensing part comprises a light emitting device(230) and a light receiving device(231). The light receiving device(231) is received a light emitted from the light emitting device(230) and transferred to an electrical value. The transferred valve is applied to a motor driving controller.
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申请公布号 |
KR20010090230(A) |
申请公布日期 |
2001.10.18 |
申请号 |
KR20000014948 |
申请日期 |
2000.03.24 |
申请人 |
ANAM SEMICONDUCTOR., LTD. |
发明人 |
KIM, SEONG YONG |
分类号 |
H01L21/66;(IPC1-7):H01L21/66 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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