发明名称 APPARATUS FOR DETECTING WAFER PROTRUSION OF SMIF SYSTEM
摘要 PURPOSE: An SMIF(Standard Mechanical Interface) system is provided to detect a protrusion of wafers loaded in an SMIF cassette, thereby preventing a breakage of the wafer. CONSTITUTION: In the SMIF system, a frame(240) for mounting a sensor for detecting a wafer protrusion surrounds a carrier(250). A sensing part is mounted to the frame(240) for detecting the protrusion of a wafer(220) loaded in each slot of the carrier(250). The sensing part comprises a light emitting device(230) and a light receiving device(231). The light receiving device(231) is received a light emitted from the light emitting device(230) and transferred to an electrical value. The transferred valve is applied to a motor driving controller.
申请公布号 KR20010090230(A) 申请公布日期 2001.10.18
申请号 KR20000014948 申请日期 2000.03.24
申请人 ANAM SEMICONDUCTOR., LTD. 发明人 KIM, SEONG YONG
分类号 H01L21/66;(IPC1-7):H01L21/66 主分类号 H01L21/66
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