发明名称 X-RAY EXAMINATION APPARATUS INCLUDING AN IMAGE SENSOR MATRIX WITH A CORRECTION UNIT
摘要 <p>An X-ray examination apparatus utilizes an image sensor matrix for picking up an X-ray image, i.e. for converting incident X-rays into electric charges. The X-ray examination apparatus includes a control circuit for controlling the image sensor matrix so as to form a dark signal. The X-ray examination apparatus also includes a correction unit which is arranged to derive the electronic image signal from the primary image and the dark signal. The electronic image signal represents image information in the X-ray image and has not been disturbed by electric charges which have been read with a delay.</p>
申请公布号 EP0809912(B1) 申请公布日期 2001.10.17
申请号 EP19960937474 申请日期 1996.11.27
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V. 发明人 MEULENBRUGGE, HENDRIK, JAN;ALVING, PETER, LEX;LUIJENDIJK, JOHANNES, ALBERT;STOUTEN, JOHANNES, JACOBUS
分类号 G01N23/04;A61B6/00;H04N5/32;H04N5/359;H04N5/365;(IPC1-7):H04N5/32 主分类号 G01N23/04
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