发明名称 |
Nonvolatile semiconductor memory, and method of manufacturing the same |
摘要 |
A method of manufacturing the semiconductor memory comprises element described below;(a) forming a first oxide film on a semiconductor substrate;(b) forming a polysilicon electrode on the first oxide film by sub-steps of forming a low impurity density polysilicon layer, forming a high impurity density polysilicon layer, and forming a low impurity density polysilicon layer in this order;(c) forming a second oxide film on the polysilicon electrode.
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申请公布号 |
US6303440(B1) |
申请公布日期 |
2001.10.16 |
申请号 |
US19980222778 |
申请日期 |
1998.12.30 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
ARAKI YOSHIKO;MORI SEIICHI |
分类号 |
H01L21/8247;H01L21/336;H01L27/115;H01L29/423;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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