发明名称 Nonvolatile semiconductor memory, and method of manufacturing the same
摘要 A method of manufacturing the semiconductor memory comprises element described below;(a) forming a first oxide film on a semiconductor substrate;(b) forming a polysilicon electrode on the first oxide film by sub-steps of forming a low impurity density polysilicon layer, forming a high impurity density polysilicon layer, and forming a low impurity density polysilicon layer in this order;(c) forming a second oxide film on the polysilicon electrode.
申请公布号 US6303440(B1) 申请公布日期 2001.10.16
申请号 US19980222778 申请日期 1998.12.30
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 ARAKI YOSHIKO;MORI SEIICHI
分类号 H01L21/8247;H01L21/336;H01L27/115;H01L29/423;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 主分类号 H01L21/8247
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