发明名称 |
EXPOSURE SYSTEM, METHOD OF MANUFACTURING DEVICE, MAINTENANCE METHOD FOR SEMICONDUCTOR MANUFACTURING PLANT AND EXPOSURE SYSTEM |
摘要 |
PROBLEM TO BE SOLVED: To efficiently manufacture a high-resolution semiconductor device by using exposing light having a short wavelength. SOLUTION: An exposure system is provided with an enclosure which contains at least part of an exposing optical axis and is hermetically sealed in a prescribed atmosphere and a detecting system having an optical system. Part of the detecting system is positioned in a first space surrounded by the enclosure and the other part is positioned in a second space provided outside the enclosure.
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申请公布号 |
JP2001284210(A) |
申请公布日期 |
2001.10.12 |
申请号 |
JP20000093449 |
申请日期 |
2000.03.30 |
申请人 |
CANON INC |
发明人 |
MURAKAMI EIICHI |
分类号 |
G03F7/20;G03F9/00;H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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