发明名称 EXPOSURE SYSTEM, METHOD OF MANUFACTURING DEVICE, MAINTENANCE METHOD FOR SEMICONDUCTOR MANUFACTURING PLANT AND EXPOSURE SYSTEM
摘要 PROBLEM TO BE SOLVED: To efficiently manufacture a high-resolution semiconductor device by using exposing light having a short wavelength. SOLUTION: An exposure system is provided with an enclosure which contains at least part of an exposing optical axis and is hermetically sealed in a prescribed atmosphere and a detecting system having an optical system. Part of the detecting system is positioned in a first space surrounded by the enclosure and the other part is positioned in a second space provided outside the enclosure.
申请公布号 JP2001284210(A) 申请公布日期 2001.10.12
申请号 JP20000093449 申请日期 2000.03.30
申请人 CANON INC 发明人 MURAKAMI EIICHI
分类号 G03F7/20;G03F9/00;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F7/20
代理机构 代理人
主权项
地址