发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING IT
摘要 PROBLEM TO BE SOLVED: To form a PNP bipolar transistor excellent in transistor characteristics and an NPN bipolar transistor in the same substrate. SOLUTION: The semiconductor device 60 comprises the PNP type bipolar transistor 66 wherein elements are isolated by an element isolation region 62 and an insulating well region 64, in a p-type substrate 68. The PNP type transistor is a perpendicular type and comprises a p-type emitter region 70, an n-type base region 72, a p-type collector region 74, and a collector electrode leading region 76. Its lower part and its periphery of the p-type collector region are electrically isolated from the substrate by an n-type lower part isolation region 78 and by an n-type circular isolation region 80, respectively. The n-type circular isolation region is formed circularly underneath from the element isolation region, surrounds the periphery of a p-type collector region and the periphery of an upper part of the n-type lower part isolation region, and isolates the p-type collector region electrically from the substrate. Because the n-type isolation region is constituted of the n-type lower part isolation and the n-type cyclic isolation region, the depth position of the n-type lower part isolation can be controlled freely, and therefore the electrical characteristics of a V-PNP can be optimized independently.
申请公布号 JP2001284462(A) 申请公布日期 2001.10.12
申请号 JP20010073445 申请日期 2001.03.15
申请人 NEC CORP 发明人 TSUTSUI YUTAKA;WAKABAYASHI MASARU
分类号 H01L21/331;H01L21/8228;H01L21/8249;H01L27/06;H01L27/082;H01L29/732;(IPC1-7):H01L21/822;H01L21/824 主分类号 H01L21/331
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