发明名称 METHOD OF PROCESSING SUBSTRATE
摘要 <p>PROBLEM TO BE SOLVED: To increase throughput by shortening time for cooling a wafer. SOLUTION: In a method of forming a film on a wafer by the use of a multi-chamber type CVD device having a transfer chamber, a cassette chamber, a cooling chamber, and a CVD chamber, three holding shelves 36A, 36b, 36C, each of which is engaged with a part of outside peripheral portion of the bottom surface of a wafer 1 for holding the wafer 1, are aligned in the top, middle, and bottom steps in a cooling space 32 of a cooling device 3 of a cooling chamber and a wafer 37 for absorbing heat is placed beforehand on the middle shelf 36B. When the wafers 1, 1, having a film formed in the CVD chamber are cooled, they are transferred to the top shelf 36A and the bottom shelf 36C, by a pair of tweezers 18a of a wafer transfer unit 18 and exchange heat with the wafer 37 on the middle shelf 36B, thereby being cooled forcibly.</p>
申请公布号 JP2001284334(A) 申请公布日期 2001.10.12
申请号 JP20000093132 申请日期 2000.03.30
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 YUYA YUKINORI
分类号 C23C16/458;H01L21/31;H01L21/68;H01L21/683;(IPC1-7):H01L21/31 主分类号 C23C16/458
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