发明名称 DEVICE AND METHOD FOR TREATING SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To make the developing capacity of a developer supplied onto a substrate uniform on the surface of the substrate. SOLUTION: The developer and a rinsing solution are simultaneously supplied onto a wafer W from a developer supply nozzle 40 and a rinsing solution supply nozzle 11 by moving the nozzles 40 and 11 while the wafer W is rotated. Since the nozzle 11 is positioned in the direction in which the rinsing solution dropped onto the wafer W is diffused, the diffused developer already used for development is immediately removed by the rinsing solution. Consequently, a new developer having a high developing power is supplied over the whole surface of the wafer W and, accordingly, no development blur occurs on the surface of the wafer W.
申请公布号 JP2001284206(A) 申请公布日期 2001.10.12
申请号 JP20000092660 申请日期 2000.03.30
申请人 TOKYO ELECTRON LTD 发明人 TOSHIMA TAKAYUKI;ORII TAKEHIKO
分类号 G03F7/30;H01L21/027;H01L21/304;H01L21/306;(IPC1-7):H01L21/027 主分类号 G03F7/30
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