发明名称 SCREENING METHOD OF LAMINATED CERAMIC ELECTRONIC COMPONENT
摘要 <p>PROBLEM TO BE SOLVED: To provide the reliable screening method for laminated ceramic electronic components that efficiently selects and removes the laminated ceramic electronic components which are in risk of internal structural defects, life time deterioration, or the like. SOLUTION: An AC voltage is applied to the laminated ceramic electronic components, a DC voltage is applied, and the quality of the laminated ceramic electronic components is judged according to an insulation resistance value, when the DC voltage is applied. As the AC voltage, an AC voltage which is 40 to 80% of the breakdown voltage is applied. As the AC voltage, an AC voltage which is 50 to 70% of the breakdown voltage is applied. As the DC voltage, a DC voltage that is equal to or two times the rated voltage is applied. This method is applicable to the screening of a laminated ceramic capacitor.</p>
申请公布号 JP2001284197(A) 申请公布日期 2001.10.12
申请号 JP20000093877 申请日期 2000.03.30
申请人 MURATA MFG CO LTD 发明人 SHIRANE TORU;NISHIYAMA SHIGENORI
分类号 G01R27/02;G01R31/00;G01R31/12;H01G13/00;(IPC1-7):H01G13/00 主分类号 G01R27/02
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