| 摘要 |
PROBLEM TO BE SOLVED: To precisely and automatically convert a test program for an IC tester into a format fitted to a different IC tester. SOLUTION: A program conversion device 1 stores the three hierarchized libraries of a main flow, a group flow and a sub-flow and precisely converts each flow of a test program by referring to the libraries at the time of converting the test program being a conversion source into the test program of the format fitted to the IC tester. Thus, it is not necessary to generate or correct the flow after the automatic conversion of the test program and work efficiency can be improved. |
