发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a semiconductor device of high integration degree per a unit area with no complicated manufacturing process. SOLUTION: There are provided a first semiconductor layer 20 provided on a translucent board 10, a gate electrode 40 provided on the first semiconductor layer 20 through a first gate insulating film 30, and a second semiconductor layer 60 provided on the gate electrode 40 through a second gate insulating film 50. The first and second semiconductor films 20 and 60 comprise channel regions 20c and 60c self-matched to the gate electrode 40.</p> |
申请公布号 |
JP2001284597(A) |
申请公布日期 |
2001.10.12 |
申请号 |
JP20000097117 |
申请日期 |
2000.03.31 |
申请人 |
TOSHIBA CORP |
发明人 |
OANA YASUHISA;YAMADA HIROSAKU |
分类号 |
G02F1/136;G02F1/1368;G09F9/30;H01L21/336;H01L27/08;H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
G02F1/136 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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