发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 <p>PROBLEM TO BE SOLVED: To provide a semiconductor device of high integration degree per a unit area with no complicated manufacturing process. SOLUTION: There are provided a first semiconductor layer 20 provided on a translucent board 10, a gate electrode 40 provided on the first semiconductor layer 20 through a first gate insulating film 30, and a second semiconductor layer 60 provided on the gate electrode 40 through a second gate insulating film 50. The first and second semiconductor films 20 and 60 comprise channel regions 20c and 60c self-matched to the gate electrode 40.</p>
申请公布号 JP2001284597(A) 申请公布日期 2001.10.12
申请号 JP20000097117 申请日期 2000.03.31
申请人 TOSHIBA CORP 发明人 OANA YASUHISA;YAMADA HIROSAKU
分类号 G02F1/136;G02F1/1368;G09F9/30;H01L21/336;H01L27/08;H01L29/786;(IPC1-7):H01L29/786 主分类号 G02F1/136
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