发明名称 TDMA POWER MEASUREMENT
摘要 A method for measuring a TDMA signal that includes TDMA bursts that may vary in burst bit structure, burst lengths, and burst rates. An exemplary method of the present invention includes the step of generating a first segment power signal that is representative of a first resolution segment of the TDMA signal. Another step of the method includes sampling the first segment power signal to obtain a first plurality of samples. Yet another step of the method includes identifying a first sample of the first plurality of samples that corresponds to a leading edge of a first TDMA burst of the plurality of TDMA bursts. The method also includes the step of obtaining a first trace vector comprising a first predetermined number of samples of the first plurality of samples that follow the first sample. The method further includes the step of updating based upon the first trace vector, a first average trace vector comprising a first plurality of average samples. Moreover, the method includes the step of determining based upon a first average sample of the first average trace vector, a first TDMA measurement value for the TDMA signal that is representative of signal power of the TDMA carrier signal.
申请公布号 WO0176109(A1) 申请公布日期 2001.10.11
申请号 WO2000US08950 申请日期 2000.04.01
申请人 WAVETEK WANDEL GOLTERMANN, INC. 发明人 BOWYER, ANDREW, E.
分类号 H04B17/00 主分类号 H04B17/00
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