发明名称 MULTIBEAM EXPOSURE APPARATUS COMPRISING MULTIAXIS ELECTRON LENS, MULTIAXIS ELECTRON LENS FOR FOCUSING MULTIPLE ELECTRON BEAM, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p>An electron beam exposure apparatus characterized by comprising a multiaxis electron lens which has a lens portion magnetic conductive part provided with apertures and arranged generally parallel and a nonmagnetic conductive part disposed between the lens portion magnetic conductive parts and provided with through holes and in which the apertures and through holes form lens apertures through which beams pass.</p>
申请公布号 WO2001075946(P1) 申请公布日期 2001.10.11
申请号 JP2001002280 申请日期 2001.03.22
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