发明名称 CLOSE PROXIMITY MATERIAL INTERFACE DETECTION FOR A MICROWAVE LEVEL TRANSMITTER
摘要 Disclosed is a method for detecting the presence of a twin peak pulse (60) in a waveform (40), generated by a microwave level transmitter (10), that is used to detect levels of first and second material interfaces (18, 20) relating to materials contained in a tank (12). The waveform (40) develops a twin peak pulse (60) when the first and second material interfaces (18, 20) are in close proximity to one another. The twin peak pulse (60) contains overlapping first and second received wave pulses (44, 46) reflected from the first and second material interfaces (18, 20), respectively. The method determines that the waveform (40) contains a twin peak pulse (60) when both a first peak point (62) relating to the first received wave pulse (44) and a valley (64) are detected. Also disclosed is a microwave level transmitter (10) having an interface detection module (32) that is configured to use the method of the present invention to detect the existence of a twin peak pulse (60) in a waveform (40).
申请公布号 WO0175475(A2) 申请公布日期 2001.10.11
申请号 WO2001US09069 申请日期 2001.03.21
申请人 ROSEMOUNT INC. 发明人 LOVEGREN, ERIC, R.;PEDERSON, DAVID, L.
分类号 G01F23/284;G01N22/00;G01S7/292;(IPC1-7):G01S15/00 主分类号 G01F23/284
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