发明名称 Measurement device directs beam to measurement scale and receives reflections of beam to produce phase shifted interference signals which are then evaluated
摘要 A radiation source (4) directs a beam to a measurement scale (8). The beam is reflected from a diffraction grating of the measurement scale into the waveguides (12,18) of a waveguide coupler (10) that outputs phase shifted interference signals which are detected by photodiodes (30,32,34) and analyzed by an evaluation unit. An independent claim is also included for a miniaturized optical scanning head.
申请公布号 DE10013725(A1) 申请公布日期 2001.10.11
申请号 DE20001013725 申请日期 2000.03.21
申请人 LASER ZENTRUM HANNOVER EV 发明人 KORTHALS, JOERN;FLUEGGE, JENS
分类号 G01D5/347;(IPC1-7):G01B11/02;G01N21/45;G01J9/02 主分类号 G01D5/347
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