发明名称 |
Measurement device directs beam to measurement scale and receives reflections of beam to produce phase shifted interference signals which are then evaluated |
摘要 |
A radiation source (4) directs a beam to a measurement scale (8). The beam is reflected from a diffraction grating of the measurement scale into the waveguides (12,18) of a waveguide coupler (10) that outputs phase shifted interference signals which are detected by photodiodes (30,32,34) and analyzed by an evaluation unit. An independent claim is also included for a miniaturized optical scanning head.
|
申请公布号 |
DE10013725(A1) |
申请公布日期 |
2001.10.11 |
申请号 |
DE20001013725 |
申请日期 |
2000.03.21 |
申请人 |
LASER ZENTRUM HANNOVER EV |
发明人 |
KORTHALS, JOERN;FLUEGGE, JENS |
分类号 |
G01D5/347;(IPC1-7):G01B11/02;G01N21/45;G01J9/02 |
主分类号 |
G01D5/347 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|