发明名称 Film-forming surface reforming method and semiconductor device manufacturing method
摘要 There is provided a film-forming surface reforming method that comprises the steps of bringing a gas or an aqueous solution containing ammonia, hydrazine, amine, amino compound or their derivative into contact with a film-forming surface before an insulating film is formed on the film-forming surface of a substrate, and bringing a gas or an aqueous solution containing hydrogen peroxide, ozone, oxygen, nitric acid, sulfuric acid or their derivative into contact with the film-forming surface.
申请公布号 US2001029109(A1) 申请公布日期 2001.10.11
申请号 US20010808016 申请日期 2001.03.15
申请人 CANON SALES CO., AND SEMICONDUCTOR PROCESS LABORATORY CO., LTD. 发明人 MAEDA KAZUO;SUZUKI SETSU;AZUMI TAKAYOSHI;SASAKI KIYOTAKA
分类号 H01L21/20;C23C16/02;C23C16/34;C23C16/40;H01L21/302;H01L21/316;(IPC1-7):H01L21/31;H01L21/469 主分类号 H01L21/20
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