发明名称 |
Multi-beam exposure apparatus using a muti-axis electron lens, electron lens convergencing a plurality of electron beam and fabrication method of a semiconductor device |
摘要 |
An electron beam exposure apparatus for exposing a wafer with a plurality of electron beams includes a multi-axis electron lens having a plurality of lens openings and a plurality of dummy openings. The lens openings allow the electron beams to pass therethrough, respectively, so as to converge the electron beams independently of each other. The dummy openings allow no electron beam to pass therethrough.
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申请公布号 |
US2001028044(A1) |
申请公布日期 |
2001.10.11 |
申请号 |
US20010824884 |
申请日期 |
2001.04.04 |
申请人 |
HAMAGUCHI SHINICHI;HARAGUCHI TAKESHI;YASUDA HIROSHI |
发明人 |
HAMAGUCHI SHINICHI;HARAGUCHI TAKESHI;YASUDA HIROSHI |
分类号 |
H01J37/317;(IPC1-7):G21G5/00;A61N5/00 |
主分类号 |
H01J37/317 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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