INTERFEROMETRIC MEASURING DEVICE

摘要

The invention relates to an interferometric measuring device (1) for measuring the form of the surface of an object (O), comprising a radiation source (LQ) emitting a short-coherent radiation, a beam splitter (ST) for forming an object ray (OS) directed towards the object (O) via an object light path and a reference ray (RS) directed towards a reference plane (RSP) via a reference light path, in addition to an image recorder (BA) that records the radiation that bounces back from the object (O) and the reference plane (RSP) and that is made to interfere and then fed to an evaluation unit for determining the form of the surface. Good adaptability and ease of handling even in poorly accessible measuring areas is achieved in that a lens (SO) is arranged in the object light path, which is rigidly mounted relative to the object (O) and in that the rigid lens (SO) is followed by a lens (BO) that moves in the direction of its optical axis.