发明名称 |
Thickness measurement device has spring link guide whose maximum linear deflection is greater than interval between start position and deflection position of scanning element |
摘要 |
A scanning system (10) has at least one spring link guide for resetting a scanning element (13) from a deflection position to the start position. The maximum linear deflection of the spring link guide is greater than the interval between the start position and the deflection position of the scanning element.
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申请公布号 |
DE10013743(A1) |
申请公布日期 |
2001.10.11 |
申请号 |
DE20001013743 |
申请日期 |
2000.03.20 |
申请人 |
GIESECKE & DEVRIENT GMBH |
发明人 |
HAEUSLER, AUGUST |
分类号 |
G01B5/06;G01B21/08;G07D7/16;(IPC1-7):G01B5/06 |
主分类号 |
G01B5/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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