Semiconductor test system with a facility for error data storage in compressed form
摘要
The memory (13) stores test data that is used by the control unit (14) to generate test and strobe signals for pin electronic module (15) coupled to the test item (19). A comparator (18) checks the actual with the test data ands updates an error memory (16).
申请公布号
DE10115572(A1)
申请公布日期
2001.10.11
申请号
DE20011015572
申请日期
2001.03.29
申请人
ADVANTEST CORP., TOKIO/TOKYO
发明人
LE, ANTHONY;RAJUSMAN, ROCHIT;TURNQUIST, JAMES ALAN;SUGAMORI, SHIGERU