发明名称 |
Semiconductor device having increased reliability and method of producing the same and semiconductor chip suitable for such a semiconductor device and method of producing the same |
摘要 |
A semiconductor device (30A) is provided, which device includes a semiconductor chip (32A) including external terminals (33) formed on a surface thereof and a sealing resin (35A) formed on the surface of the semiconductor chip (32A). A contaminant film (48) formed on the surface of said semiconductor chip (32A) has a laser-processed edge so that a peripheral portion of the surface of said semiconductor chip (32A) is bonded to the sealing resin (35A). <IMAGE> |
申请公布号 |
EP1143510(A2) |
申请公布日期 |
2001.10.10 |
申请号 |
EP20000310281 |
申请日期 |
2000.11.20 |
申请人 |
FUJITSU LIMITED |
发明人 |
FUKASAWA, NORIO;KAWAHARA, TOSHIMI;HOZUMI, TAKASHI |
分类号 |
H01L23/29;H01L21/301;H01L21/56;H01L23/31;H01L23/50;H01L29/06 |
主分类号 |
H01L23/29 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|