发明名称 Semiconductor device having increased reliability and method of producing the same and semiconductor chip suitable for such a semiconductor device and method of producing the same
摘要 A semiconductor device (30A) is provided, which device includes a semiconductor chip (32A) including external terminals (33) formed on a surface thereof and a sealing resin (35A) formed on the surface of the semiconductor chip (32A). A contaminant film (48) formed on the surface of said semiconductor chip (32A) has a laser-processed edge so that a peripheral portion of the surface of said semiconductor chip (32A) is bonded to the sealing resin (35A). <IMAGE>
申请公布号 EP1143510(A2) 申请公布日期 2001.10.10
申请号 EP20000310281 申请日期 2000.11.20
申请人 FUJITSU LIMITED 发明人 FUKASAWA, NORIO;KAWAHARA, TOSHIMI;HOZUMI, TAKASHI
分类号 H01L23/29;H01L21/301;H01L21/56;H01L23/31;H01L23/50;H01L29/06 主分类号 H01L23/29
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