GATE GENERATING CIRCUIT, SEMICONDUCTOR MEASURING INSTRUMENT, AND SEMICONDUCTOR MEASURING METHOD

摘要

PROBLEM TO BE SOLVED: To measure a waveform whose pulse width or pulse level is random even by a semiconductor measuring instrument which does not have a setting function for a gate signal. SOLUTION: Pulses 4 to be measured which are outputted successively in the order of 1, 2... (N-1), N, (N+1)... (N: integer) and have random pulse widths are inputted, and a pulse specifying circuit 7 specifies the arbitrary Nth pulse and a gate generating circuit 3 generates a gate signal which is actuated between the end of the (N-1)th pulse and the actuation of the Nth pulse and ends between the end of the Nth pulse and the actuation of the (N+1)th pulse and a semiconductor measuring instrument 15 measures the pulse width of the Nth pulse by using the gate signal.