发明名称 |
METHOD AND DEVICE FOR X-RAY FLUORESCENCE ANALYSIS |
摘要 |
<p>PROBLEM TO BE SOLVED: To perform an accurate X-ray fluorescence analysis of an arbitrary minute portion of a sample. SOLUTION: An adjustment sample 11 is used that has an area containing an objective element and having a rectilinear visible outline f on its surface. The adjustment sample 11 is placed on an r-θstage 5 so that the visible outline makes right angles with the r-direction in top plan view. While moving the sample in the r-direction, the intensity distribution of fluorescent X rays is measured with respect to the objective element. The adjustment sample 11 is 180 deg. rotated on the r-θstage 5 and the intensity distribution of fluorescent X rays is again measured in the same way. Based on the results of the distribution measurement, a position is found where the center of rotation of the r-θstage 5 agrees with a position faced on by a detection means 3 through an aperture 4a at a prescribed height above a surface of the sample in the r- direction movement of the r-θstage 5.</p> |
申请公布号 |
JP2001281177(A) |
申请公布日期 |
2001.10.10 |
申请号 |
JP20000100417 |
申请日期 |
2000.04.03 |
申请人 |
RIGAKU INDUSTRIAL CO |
发明人 |
YAGI KEISUKE;YAMAMOTO ETSUHISA;INOUE TATSUYA;KATAOKA YOSHIYUKI |
分类号 |
G01N23/223;(IPC1-7):G01N23/223 |
主分类号 |
G01N23/223 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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