发明名称 |
POLISHING PAD FOR SEMICONDUCTOR WAFER |
摘要 |
PROBLEM TO BE SOLVED: To provide a belt type polishing pad eliminating a decrease in mass productivity due to frequent dressing work and pad replacement in the conventional polishing table system and eliminating necessity for groove forming of the polishing pad by after work. SOLUTION: This polishing pad for a semiconductor wafer, constituted by arranging an abrasive material pattern formed by a fixed pitch in a belt direction on a belt-state carrier film, is used. |
申请公布号 |
JP2001277104(A) |
申请公布日期 |
2001.10.09 |
申请号 |
JP20000097845 |
申请日期 |
2000.03.30 |
申请人 |
HITACHI CHEM CO LTD |
发明人 |
ICHIMURA SHIGEKI;MUTO KUNITERU;OSE RYOJI |
分类号 |
B41M3/00;B24B21/00;B24B37/20;B24B37/24;B24B37/26;H01L21/304 |
主分类号 |
B41M3/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|