发明名称 Method of forming metal wiring film
摘要 This invention provides a method of forming a metal wiring film excellent in EM resistance and low electric resistance.In a method of forming a wiring structure by filming and covering the surface of the insulating film of a substrate to be treated having a hole or groove formed thereon with a metallic material such as copper, aluminum, silver or the like, thereby filling the hole or groove inner part with the metallic material to form a wiring structure, the substrate to be treated is exposed to a high temperature under a high-pressure gas atmosphere after the continuous filming and covering with the metallic material along the inner surface profile of the hole or groove, whereby the surface diffusion phenomenon of the metallic material is promoted to reform the metal film into a film structure as the surface area of the metal film is minimized.
申请公布号 US6299739(B1) 申请公布日期 2001.10.09
申请号 US19990294031 申请日期 1999.04.20
申请人 KABUSHIKI KAISHA KOBE SEIKO SHO 发明人 FUJIKAWA TAKAO;ISHII TAKAHIKO;NARUKAWA YUTAKA;KADOGUCHI MAKOTO;MIZUSAWA YASUSHI;KONDOU TOMOYASU;TAGUCHI YUJI
分类号 C23C14/34;C23C14/04;C23C14/58;H01L21/285;H01L21/768;(IPC1-7):C23C14/14;C23C16/46;C23C16/48 主分类号 C23C14/34
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