发明名称 Method for patterning a buried oxide thickness for a separation by implanted oxygen (simox) process
摘要 A method of forming a patterned buried oxide film, includes performing an implantation into a substrate, forming a mask on at least portions of the substrate for controlling the implantation diffusion, and annealing the substrate to form a buried oxide. The mask may be selectively patterned. A region that is covered by the mask has a thinner buried oxide than an area which is exposed directly to the annealing ambient.
申请公布号 US6300218(B1) 申请公布日期 2001.10.09
申请号 US20000567095 申请日期 2000.05.08
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 COHEN GUY MOSHE;SADANA DEVENDRA KUMAR
分类号 H01L21/76;H01L21/02;H01L21/265;H01L21/762;H01L27/12;(IPC1-7):H01L21/76 主分类号 H01L21/76
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