发明名称 |
Method for patterning a buried oxide thickness for a separation by implanted oxygen (simox) process |
摘要 |
A method of forming a patterned buried oxide film, includes performing an implantation into a substrate, forming a mask on at least portions of the substrate for controlling the implantation diffusion, and annealing the substrate to form a buried oxide. The mask may be selectively patterned. A region that is covered by the mask has a thinner buried oxide than an area which is exposed directly to the annealing ambient.
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申请公布号 |
US6300218(B1) |
申请公布日期 |
2001.10.09 |
申请号 |
US20000567095 |
申请日期 |
2000.05.08 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
COHEN GUY MOSHE;SADANA DEVENDRA KUMAR |
分类号 |
H01L21/76;H01L21/02;H01L21/265;H01L21/762;H01L27/12;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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