| 摘要 |
The present invention comprises an apparatus and corresponding method for performing a built-in self-test (BIST) of a data communications system. The apparatus of the invention includes a transmitter, a receiver coupled to the transmitter and a test control system coupled to the transmitter and receiver for measuring a data error rate of the data communications system. The transmitter, receiver and test control system are disposed on a common substrate, such as an integrated circuit. |
