| 摘要 |
A handling assembly for handling integrated circuits and trays for receiving these integrated circuits, the handling assembly comprising at least one integrated circuit manipulator having a holder pivoted on a fixed axis of rotation; the holder having a plurality of grippers arranged substantially in the plane passing through said axis of rotation, the holder being adapted to rotate said plurality of grippers at least to a first and second angular positions, a tray transporter adapted to move a tray into an operational position in which at least one of the integrated circuits in the tray is engageable by at least one of the grippers rotated to the first angular position, and an integrated circuit receiving/releasing means engageable by at least one of the grippers rotated to the second angular position. An integrated circuit handling apparatus used in combination with a testing apparatus and applicable for handling integrated circuits and trays for receiving thereof. The said handling assemblies are used in the handling apparatus for performing the three following operations: receiving a tray of integrated circuits to be tested and transporting the tray to an operational position where the integrated circuits are transferred from the tray to test sockets of the testing apparatus and back to the tray, separating the tested integrated circuits by quality according to their test results, and placing the tested integrated circuits in trays for discharging. |
