| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a liquid crystal panel inspection method for detecting deterioration or breakdown of the semiconductor elements formed in the liquid crystal panel due to heat generation and lack of an ON-state current, and detecting a liquid crystal panel in danger of display failure within a short time. SOLUTION: In a configuration of the liquid crystal panel which comprises a 1st inverter element composed of semiconductor elements having a maximum W/L value or larger among all the semiconductor elements composing the liquid crystal panel and a 2nd inverter element composed of semiconductor elements having a minimum W/L value or smaller among all the semiconductor elements composing the liquid crystal element, and to which at least one of the 1st and 2nd inverter elements is added separately from a picture display part and a driving circuit part, the configuration is aged with a signal also applied to the added 1st and 2nd inverter elements while letting the liquid crystal panel operate and display a picture thereon.</p> |
