发明名称 METHOD OF MANUFACTURING COMPOUND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing semiconductor method in which a double-recess structure can be formed with high reproducibility through a small number of lithographic steps. SOLUTION: This method of forming compound semiconductor comprises a first step of forming a buffer layer 102, a channel layer 103, a contact layer 104 on a semi-insulating semiconductor substrate 101, a second step of forming a resist mask 107 partially having an opening 107a on the contact layer 104, and a third step of forming a first recess structure R1 by performing isotropic etching through the opening 107a of the mask 107. This method also comprises a fourth step of forming a second recess structure R2, by performing anisotropic etching through the opening 107a.
申请公布号 JP2001274173(A) 申请公布日期 2001.10.05
申请号 JP20000086843 申请日期 2000.03.27
申请人 TOSHIBA CORP 发明人 KUZUHARA TORU
分类号 H01L21/302;H01L21/3065;H01L21/338;H01L29/812;(IPC1-7):H01L21/338;H01L21/306 主分类号 H01L21/302
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