| 摘要 |
PROBLEM TO BE SOLVED: To provide an integrated semiconductor memory constituted so that a redundant memory cell unit can be tested and the circuit configuration therefor is scarcely complexed inevitably. SOLUTION: This memory is provided with a memory cell MC arranged as a normal unit WL being addressable, a memory cell MC arranged as at least one unit RWL1 to replace the normal unit, an address bus 3 to which an address ADR can be applied, a redundant circuit 1 for selecting a redundant unit RWL1 connected to this address bus 3, and a processing unit 2. The processing unit 2 is connected to a terminal A of the address bus 3 at an input side, and connected to an input side of the redundant circuit 1 at an output side. The redundant unit RWL1 can be tested before programming of restoration information in the redundant circuit 1, moreover, the circuit is not made complex so much.
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