| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor IC device which can be monitored for a delay time and can be tested for functions without increasing the circuit size. SOLUTION: The semiconductor IC device comprises a selector section 11, a first latch section 12 and second latch section 13, The selector section 11 selects either a signal D for normal operation or an input signal SI for circuit analysis according to a first input signal SMC for switching a mode. According to a second input signal LDP for switching a mode, the first latch section 12 and second latch section 13 select and execute either a scan test mode for holding or transmitting the signal selected by the selector section 11 (hereinafter called 'transmission signal') according to a clock signal T or a Long Delay Path function mode for transmitting the transmission signal regardless of the state of the clock signal T.
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