发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR
摘要 PROBLEM TO BE SOLVED: To enable an excellent integrated circuit pattern to be formed when an semiconductor is manufactured by a method wherein a BARL film is made to display its function sufficiently, and the BARL film is improved in bonding properties to a resist film. SOLUTION: A semiconductor manufacturing process comprises a first process in which an antireflection film is formed on a substrate, a second process in which an oxide film is formed on the antireflection film, and a third process in which resist is applied onto the oxide film.
申请公布号 JP2001274053(A) 申请公布日期 2001.10.05
申请号 JP20000083748 申请日期 2000.03.24
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 TANIGUCHI TAKESHI
分类号 C23C16/30;H01L21/027;H01L21/316;(IPC1-7):H01L21/027 主分类号 C23C16/30
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