| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated-circuit device which comprises a test circuit hardly influencing the operation of an ordinary circuit and having a small chip area and which can be tested by an easy method. SOLUTION: A CMOS integrated-circuit device is provided with a MOS element (a test point cell) which is connected to the observation point of the integrated-circuit device. When a first control signal is input to the gate terminal of the MOS element, the MOS element is set to continuity, and a power-supply current flows to the integrated-circuit device. When a second control signal is input to the gate terminal, the MOS element is set to a cutoff state and the power-supply current does not flow to the integrated-circuit device in a static state. In a state that the MOS element is set to continuity, the power- supply current of the integrated-circuit device is measured. Thereby, whether the logical value of the observation point is correct or not is judged.
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