发明名称 SAMPLE HOLDER
摘要 PROBLEM TO BE SOLVED: To enable use of a sample holder used in an STM as an aperture holder which is used in an FEM or an FIM. SOLUTION: This sample holder SH has a carrier bar connection member SH2 and a stage attaching/detaching member SH1, which are constituted attachable to and detachable from each other. The sample holder SH is carried by a holder carrier bar HB rotatably about the axis and movable back and forth relative to a sample stage, and is detachably installed to the sample stage. The stage attaching/detaching member SH1 has a tube-like body 46 with a through-hole 46a, formed between a sample stage side end part and a holder carrier bar side end part, and electrons or ions can pass therethrough in a state of separation of the carrier bar connection member SH2.
申请公布号 JP2001272324(A) 申请公布日期 2001.10.05
申请号 JP20000084902 申请日期 2000.03.24
申请人 JEOL LTD 发明人 WATANABE TAKASHI
分类号 G01N1/00;G01Q30/08;G01Q30/20;G01Q60/10;H01J37/20;(IPC1-7):G01N13/10;G01N13/12 主分类号 G01N1/00
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