发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device having an SOI structure, by which a high-quality semiconductor device having a plurality of stable elements can be manufactured at high density on the same substrate. SOLUTION: Oxygen ions are selectively implanted in an SOI substrate having a single-crystal silicon layer 1 of a prescribed thickness on a first embedded SiO2 layer 3a to form a second SiO2 layer 3b embedded in a shallow portion. Subsequently, a deep trench isolation region 4 is formed to isolate a first region 7 from a second region 8. A bipolar transistor is formed on a thick single crystal silicon layer in the first region 7. An SOI-MOS transistor is formed on a thin single crystal silicon layer 8a on the SiO2 layer 3b embedded in the second region 8.
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申请公布号 |
JP2001274234(A) |
申请公布日期 |
2001.10.05 |
申请号 |
JP20000086812 |
申请日期 |
2000.03.27 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
SUGIURA MITSUO |
分类号 |
H01L21/76;H01L21/762;H01L21/8249;H01L27/06;H01L27/08;H01L27/12;H01L29/786;(IPC1-7):H01L21/76;H01L21/824 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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