发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device having an SOI structure, by which a high-quality semiconductor device having a plurality of stable elements can be manufactured at high density on the same substrate. SOLUTION: Oxygen ions are selectively implanted in an SOI substrate having a single-crystal silicon layer 1 of a prescribed thickness on a first embedded SiO2 layer 3a to form a second SiO2 layer 3b embedded in a shallow portion. Subsequently, a deep trench isolation region 4 is formed to isolate a first region 7 from a second region 8. A bipolar transistor is formed on a thick single crystal silicon layer in the first region 7. An SOI-MOS transistor is formed on a thin single crystal silicon layer 8a on the SiO2 layer 3b embedded in the second region 8.
申请公布号 JP2001274234(A) 申请公布日期 2001.10.05
申请号 JP20000086812 申请日期 2000.03.27
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 SUGIURA MITSUO
分类号 H01L21/76;H01L21/762;H01L21/8249;H01L27/06;H01L27/08;H01L27/12;H01L29/786;(IPC1-7):H01L21/76;H01L21/824 主分类号 H01L21/76
代理机构 代理人
主权项
地址