发明名称 METHOD FOR DETERMINING AN INDEX OF REFRACTION
摘要 <p>According to the inventive method, the substance for which the index of refraction is to be determined is first prepared in the form of a theoretically determinable scattering arrangement or diffraction arrangement. Two or more diffraction orders are then established for the purpose of producing at least one intensity ratio. At least one intensity distribution is produced by irradiating the scattering arrangement with a light beam with a defined shape. The intensity ratio is then produced using the diffraction orders of the intensity distribution. At least part of a characteristic curve which represents the dependency of the intensity ratio on the index of refraction and which can be used to allocate the corresponding index of refraction to the intensity ratio that is produced is also determined.</p>
申请公布号 WO2001073404(A1) 申请公布日期 2001.10.04
申请号 EP2001003386 申请日期 2001.03.24
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