发明名称 Semiconductor devices including back-surface-incidence CCD light-sensors, and methods for manufacturing same
摘要 Methods are disclosed for fabricating any of various semiconductor devices that include a reinforcing substrate bonded to a device substrate, wherein stresses between the two substrates are reduced compared to conventional devices. In the context of a back-surface-incidence (BSI) CCD light sensor, one or more pixels of a light-sensing array are formed on the surface of a "CCD" or "device" substrate. A layer of a curable resin adhesive is applied to the upper surface of the device substrate. A reinforcing substrate (e.g., glass) is placed on the layer of uncured adhesive, and the adhesive is cured. After curing the resin adhesive has a hardness of no greater than 40 (as measured by the JIS-A standard). With such an adhesive, when the resin adhesive cures, no stress is applied to the device substrate even a difference exists in the thermal expansion coefficients of the cured adhesive and the device substrate.
申请公布号 US2001026001(A1) 申请公布日期 2001.10.04
申请号 US20010805669 申请日期 2001.03.13
申请人 NIKON CORPORATION 发明人 YAGI TAKESHI
分类号 H01L31/02;H01L27/148;H01L31/09;(IPC1-7):H01L31/00 主分类号 H01L31/02
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