发明名称 METHOD OF FABRICATING INTERCONNECT
摘要 A method fabricating an interconnect. A sacrificial layer is formed on a substrate. The sacrificial is patterned for form an opening, followed by filling the opening with a metal interconnect. The sacrificial layer is removed, and a barrier layer is formed to cover the metal interconnect and the substrate. The barrier layer is conformal to the surface profile of the substrate having a metal interconnect thereon. A dielectric layer is formed on the barrier layer.
申请公布号 US2001027014(A1) 申请公布日期 2001.10.04
申请号 US19990228435 申请日期 1999.01.11
申请人 SUN SHIH-WEI 发明人 SUN SHIH-WEI
分类号 H01L21/768;(IPC1-7):H01L21/476;H01L21/44 主分类号 H01L21/768
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