| 摘要 |
An integrated circuit includes a differential amplifier having a first terminal that is operable to receive an input signal and having a second terminal. The integrated circuit also includes a reference circuit that generates a reference signal on the second terminal of the amplifier. During testing of the integrated circuit, the reference circuit can be activated to generate the reference signal such that a tester need not supply it as a test signal. During normal operation, however, either the reference circuit can generate the reference signal or the reference signal can be supplied by an external source.
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