发明名称 Method and apparatus for testing of sheet material
摘要 An apparatus for testing of electrical, mechanical, physical and/or chemical properties of material in sheet form includes a cassette for holding of sheets and sensors rigidly mounted relative to the cassette. The sensors may be mounted adjacent a test location exterior to the cassette. The cassette and the sensors may be so configured and positioned that a suitable end effector may move sheets of material between storage locations in the cassette and test locations adjacent the sensors. A method for testing sheet material includes the steps of placing the sheet material in a cassette, and conducting tests employing one or more sensors rigidly mounted with respect to the cassette. The method may include employing an end effector to remove the sheet from the cassette, to position the sheet stepwise in several positions relative to the sensors, and to replace the sheet in the cassette upon completion of testing. Materials to be tested include flat panels for computer screens and other applications and semiconductor wafers.
申请公布号 US2001025528(A1) 申请公布日期 2001.10.04
申请号 US20010812741 申请日期 2001.03.20
申请人 BLEW AUSTIN R.;EIDUKONIS ALEXANDER 发明人 BLEW AUSTIN R.;EIDUKONIS ALEXANDER
分类号 G01B21/00;B65G49/07;G01N21/86;G01N21/958;G01N35/00;H01L21/00;H01L21/66;H01L21/673;H01L21/677;(IPC1-7):G01L5/04 主分类号 G01B21/00
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