发明名称 |
Method of forming thin film onto semiconductor substrate |
摘要 |
In a plasma CVD apparatus including a reaction chamber and a susceptor (3) to form a thin film on a semiconductor substrate, a pretreatment step is conducted to form a surface layer (20) on the surface of the susceptor so that the surface layer can prevent the semiconductor (11) substrate from electrostatically adhering to the surface of the susceptor. The pretreatment step includes steps of introducing into the reaction chamber a gas containing, e.g., the same gas as the gas for use in a film-forming treatment, and forming a surface layer on the susceptor surface by a CVD process. |
申请公布号 |
EP1138801(A1) |
申请公布日期 |
2001.10.04 |
申请号 |
EP20010302548 |
申请日期 |
2001.03.19 |
申请人 |
ASM JAPAN K.K. |
发明人 |
FUKUDA, HIDEAKI;ARAI, HIROKI |
分类号 |
C23C16/44;C23C16/458;H01L21/205;H01L21/683 |
主分类号 |
C23C16/44 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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