发明名称 Apparatus for Heat-treating substrate
摘要 A heat treatment apparatus permits manufacture of a high-accuracy resist pattern by reducing a temperature difference within a substrate surface in the transition state of heating or cooling the substrate and the steady state. The heat treatment apparatus includes a thermal plate having a main surface containing a first area on which the substrate is to be placed and a second area surrounding the first area, heat capacity per unit area in the second area of the main surface being smaller than heat capacity per unit area in the first area of the main surface; and a temperature control element for controlling temperature of the thermal plate in accordance with supplied current.
申请公布号 US2001025795(A1) 申请公布日期 2001.10.04
申请号 US20010817743 申请日期 2001.03.27
申请人 TAKANO MICHIRO;KATADA OSAMU 发明人 TAKANO MICHIRO;KATADA OSAMU
分类号 H01L21/00;(IPC1-7):G01L1/20 主分类号 H01L21/00
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